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SPECTROSCOPY AND SPECTRAL ANALYSIS  2016, Vol. 36 Issue (08): 2664-2668    DOI: 10.3964/j.issn.1000-0593(2016)08-2664-05
光谱学与光谱分析 |
The Study of Precision Measurement Technology Based on AOTF Imaging Spectrum
XUE Peng1, 2, 3, WANG Zhi-bin1, 2, 3*, ZHANG Rui1, 3, XUE Rui2, 3, ZHAO Tong-lin1, 3
1. Key Lab of Electronic Testing Technology, North University of China, Taiyuan 030051, China2. College of Science, North University of China, Taiyuan 030051, China3. Engineering Technology Research Center of Shanxi Province for Opto-Electronic Information and Instrument, Taiyuan 030051, China