加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2016, Vol. 36 Issue (07): 2279-2283    DOI: 10.3964/j.issn.1000-0593(2016)07-2279-05
光谱学与光谱分析 |
Research on M Dwarf Sub-Classification Based on the Measurement of Residual Distribution
KANG Chao1, PAN Jing-chang1*, YI Zhen-ping1, WEI Peng2, JIANG Bin1
1. School of Mechanical, Electrical & Information Engineering, Shandong University, Weihai, Weihai 264209, China2. Key Laboratory of Optical Astronomy, National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China