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SPECTROSCOPY AND SPECTRAL ANALYSIS  2016, Vol. 36 Issue (04): 1261-1265    DOI: 10.3964/j.issn.1000-0593(2016)04-1261-05
光谱学与光谱分析 |
In Situ Raman Spectrum Peak Test of Monocrystalline Silicon Wafer under Quantitative Uniaxial Pressure
XIE Chao1, DU Jian-guo1*, LIU Lei1, YI Li1, LIU Hong1, CHEN Zhi1, LI Jing2
1. CEA Key Laboratory of Earthquake Prediction (Institute of Earthquake Science, China Earthquake Administration), Beijing 100036, China2. Institute of Disaster Prevention, Yanjiao 065201, China