光谱学与光谱分析 |
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Development of a High Resolution Simultaneous Microwave Plasma Torch Spectrometer |
JIANG Jie1,HUAN Yan-fu1,JIN Wei2,FENG Guo-dong1,FEI Qiang1,CAO Yan-bo1,JIN Qin-han1,2* |
1. College of Chemistry, Jilin University, Jilin Province Research Center for Engineering and Technology of Spectral Analytical Instruments, Changchun 130023, China 2. Research Center for Analytical Instrumentation, Zhejiang University, Hangzhou 310058, China |
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Abstract A unique high resolution simultaneous microwave plasma torch (MPT) atomic emission spectrometer was developed and studied preliminarily. Some advanced technologies were applied to the spectrometer, such as echelle grating, UV-intensified CCD array detector, adjustable microwave generator, and water cooling system for the generator, etc. The detection limits of the spectrometer for some elements were determined, the spectral resolution and pixel resolution of the spectrometer were calculated, and an analysis of a practical sample was carried out. The preliminary results demonstrate that such simultaneous spectrometer has advantages of saving sample and time, possessing high sensitivity and resolution, and low-cost for the purchase and maintenance. Taking analytical figures of merit into consideration, the high resolution simultaneous MPT spectrometer will have extended application areas and greater competition potential as compared with sequential MPT spectrometers.
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Received: 2006-05-15
Accepted: 2006-09-30
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Corresponding Authors:
JIN Qin-han
E-mail: qhjin@jlu.edu.cn
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Cite this article: |
JIANG Jie,HUAN Yan-fu,JIN Wei, et al. Development of a High Resolution Simultaneous Microwave Plasma Torch Spectrometer[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2007, 27(11): 2375-2379.
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URL: |
https://www.gpxygpfx.com/EN/Y2007/V27/I11/2375 |
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