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SPECTROSCOPY AND SPECTRAL ANALYSIS  2015, Vol. 35 Issue (07): 1770-1773    DOI: 10.3964/j.issn.1000-0593(2015)07-1770-04
光谱学与光谱分析 |
Spectral Characteristics of Si Quantum Dots Embedded in SiNx Thin Films Prepared by Magnetron Co-Sputtering
CHEN Xiao-bo1, 2, YANG Wen1, DUAN Liang-fei1, ZHANG Li-yuan1, YANG Pei-zhi1*, SONG Zhao-ning3
1. Key Laboratory of Ministry of Education for Advance Technique and Preparation of Renewable Energy Materials, Institute of Solar Energy, Yunnan Normal University, Kunming 650500, China2. School of Physics and Mech-Tronic Engineering, Sichuan University of Arts and Science, Dazhou 635000, China3. Department of Physics and Astronomy, University of Toledo, Toledo, OH 43606, USA