两种Z箍缩X射线总能量测量技术对比

doi:10.3964/j.issn.1000-0593(2015)03-0829-05

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Abstract Resistive bolometer and scintillant detection system are two mainly Z-pinch X-ray yield measure techniques which are based on different diagnostic principles. Contrasting the results from two methods can help with increasing precision ofX-ray yield measurement. Experiments with different load material and shape were carried out on the “QiangGuang-I” facility. For Al wire arrays, X-ray yields measured by the two techniques were largely consistent. However, forinsulating coating W wire arrays, X-ray yields taken from bolometer changed with load parameters while data from scintillant detection system hardly changed. Simulation and analysis draw conclusions as follows: (1) Scintillant detection system is much more sensitive to X-ray photons with low energy and its spectral response is wider than the resistive bolometer. Thus, results from the former method are always larger than the latter. (2) The responses of the two systems are both flat to Al plasma radiation. Thus, their results are consistent for Al wire array loads. (3) Radiation form planar W wire arrays is mainly composed of sub-keV soft X-ray. X-ray yields measured by the bolometer is supposedto be accurate because of the nickel foil can absorb almost all the soft X-ray. (4) By contrast, using planar W wire arrays, data from scintillant detection system hardly change with load parameters. A possible explanation is that while the distance between wires increases, plasma temperature at stagnation reduces and spectra moves toward the soft X-ray region. Scintillator is much more sensitive to the soft X-ray below 200 eV. Thus, although the total X-ray yield reduces with large diameter load, signal from the scintillant detection system is almost the same. (5) Both Techniques affected by electron beams produced by the loads.

Key words：Resistive bolometer;Scintillant detection system;X-ray yield measurement;Z-pinch;plasma

Received: 2013-10-21 Accepted: 2014-05-06

ZTFLH:

O536

Corresponding Authors: LI Mo E-mail: limo@nint.ac.cn

Cite this article:

LI Mo,WANG Liang-ping,SHENG Liang, et al. Contrast of Z-Pinch X-Ray Yield Measure Technique [J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2015, 35(03): 829-833.

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https://www.gpxygpfx.com/EN/10.3964/j.issn.1000-0593(2015)03-0829-05 OR https://www.gpxygpfx.com/EN/Y2015/V35/I03/829