| 光谱学与光谱分析 |
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| Photoelectric Parametric Test System of LED Based on Virtual Instrument |
| YANG Song-tao1,4,5, WANG Jing3, WANG Li-dong2, LIANG Pei1*, DONG Qian-min1 |
1. College of Opto-Electronic Science and Technology, China Jiliang University, Hangzhou 310018, China
2. Zhejiang Institute of Metrology, Hangzhou 310013, China
3. Hangzhou Juguang Science and Technology Company Ltd., Hangzhou 310052, China
4. State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China
5. CNERC for Optical Instrument, Zhejiang University, Hangzhou 310027, China |
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Abstract The standardized measuring principle, requirements and implementations of the above parameters of LEDs were researched and analyzed in the present paper. Then a comprehensive test system involved with optics, machinery and computer was designed to accomplish data acquisition, algorithm design and interface design on virtual instrument using NI data acquisition card USB6210. And convincing results of LEDs’ parameters, including peak wavelength, width of half-peak wavelength, centroid wavelength, chromaticity coordinates, purity, correlated color temperature and the forward voltage/current, were achieved with good consistency based on the measured spectrum. The system owns simple interface, reliable algorithms and stable results. Respective measurements on five kinds of color of LED result in an average error less than 3%, which show an ideal performance of the system.
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Received: 2013-11-21
Accepted: 2014-02-05
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Corresponding Authors:
LIANG Pei
E-mail: plianghust@gmail.com
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