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SPECTROSCOPY AND SPECTRAL ANALYSIS  2014, Vol. 34 Issue (02): 557-561    DOI: 10.3964/j.issn.1000-0593(2014)02-0557-05
光谱学与光谱分析 |
High Accuracy Sample Positioning System for Hard X-Ray Microprobe
ZHANG Ji-chao, LIANG Dong-xu, HE Yan, LI Ai-guo, YU Xiao-han*
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China