微波辅助电感耦合等离子体光谱法进行RoHS限定的重金属检测

doi:10.3964/j.issn.1000-0593(2008)11-2665-06

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Abstract The harm of heavy metals contained in electronic and electrical equipment (EEE) on environment is of high concern by human. Aiming to handle the great challenge of RoHS compliance, the determinations of trace or ultratrace chromium (Cr), cadmium (Cd), mercury (Hg) and lead (Pb) by inductively coupled plasma optical emission spectrometry (ICP-OES) was performed in the present paper, wherein, microwave extraction technology was used to prepare the sample solutions. In addition, the precision, recovery, repeatability and interference issues of this method were also discussed. The results exhibited that using the microwave extraction system to prepare samples is more quick, lossless, contamination-free in comparison with the conventional extraction methods such as dry ashing, wet-oven extraction etc. By analyzing the recoveries of these four heavy metals over different working time and wavelengths, the good recovery range between 85% and 115% showed that there was only tiny loss or contamination during the process of microwave extraction, sample introduction and ICP detection. Repeatability experiments proved that ICP plasma had a good stability during the working time and the matrix effect was small. Interference was a problem troublesome for atomic absorption spectrometry (AAS), however, the techniques of standard additions or inter-element correction (IEC) method can effectively eliminated the interferences of Ni, As, Fe etc. with the Cd determination. By employing the multi-wavelengths and two correction point methods, the issues of background curve sloping shift and spectra overlap were successfully overcome. Besides, for the determinations of trace heavy metal elements, the relative standard deviation (RSD) was less than 3% and the detection limits were less than 1 μg·L^-1(3σ, n=5)for samples, standard solutions, and standard additions, which proved that ICP-OES has a good precision and high reliability. This provided a reliable technique support for electronic and electrical (EE) industries to comply with RoHS directive.

Key words：RoHS directive;Heavy metal determinations;ICP-OES;Microwave extraction;Inter-element correction method

Received: 2007-08-06 Accepted: 2007-11-06

ZTFLH:

O657.3

Corresponding Authors: WU Yi-ping E-mail: ypwu@mailhust.edu.cn

Cite this article:

HUA Li,WU Yi-ping,AN Bing, et al. Determination of Heavy Metals for RoHS Compliance by ICP-OES Spectrometry Coupled with Microwave Extraction System[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2008, 28(11): 2665-2670.

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https://www.gpxygpfx.com/EN/10.3964/j.issn.1000-0593(2008)11-2665-06 OR https://www.gpxygpfx.com/EN/Y2008/V28/I11/2665

[1] Directive 2002/95/EC of the European Parliament and of the Council on the Restriction of Theuse of Certain Hazardous Substances in Electrical and Electronic Equipment. Official Journal of the European Union， 2003, 1(27): 19.
[2] Mohammad B S, Shiina Y, Kivscht F G, et al. Materials Science and Engineering B-Solid State Materials, 2003, 102(3): 202.
[3] Roger R. Introduction to Environmental Analysis. Joan Wiley ＆ Sons Ltd, 2002.
[4] Bettinelli M, Baroni U, Pastorelli N. in: Applicazioni Dell ICP-AES Nel Laboratorio Chimico Etossicologico, Vol.1, Morgan, Milano, 1993. 529.
[5] Mousty F, Passarella R, Pigozzi G, et al. in: Applicazioni Dell’ICP-AES Nel Laboratorio Chimico Etossicologico, Vol.1, Morgan, Milano, 1993. 561.
[6] Charun Y, Farmer John G. Analytica Chimica Acta, 2006, 557: 296.
[7] Shiquan T, Takahiro K. Analytica Chimica Acta, 1995，310: 369.
[8] International Electrotechnical Committee (IEC), Procedures for the Determination of Levels of Regulated Substances in Electrotechnical Products, 2005 International Electrotechnical Commission conference in Italy, No.62321, Ed.1, 2002，(8): 22.
[9] ISO 5725 Series: Accuracy (Trueness and Precision ) of Measurement Methods and Results.
[10] Boss Charles B，Fredeen Kenneth J. Concepts, Instrumentation, and Techniques in Inductively Coupled Plasma Optical Emission Spectrometry. Perkin Elmer Corp., Ed.2, USA, Norwalk, 1999.
[11] Awad A M, George A Z, Aristidis N A, et al. Analytica Chimica Acta, 2006，565: 81.
[12] Ramsey M H, Thompson M. Analyst, 1985, 110: 519.
[13] Information Industry Standard of the People’s Republic of China (中华人民共和国信息产业行业标准). Testing Methods for Hazardous Substances in Electronic Information Products(电子信息产品中限用物质的检测方法). Beijing: Ministry of Information Industry of the People’s Republic of China(北京：中华人民共和国信息产业部)，No.SJ/T11365，2006.
[14] Bettinelli M, Beone G M, Spezia S, et al. Analytica Chimica Acta, 2000，424: 289.
[15] Zarcinas B A. Science of the Total Environment, 2002, 295(1-3): 241.
[16] Miller J. Statistics for Analytical Chemistry, 4th ed. New York：Prenticehall, 2000.
[17] Jianrong C, Khay C T. Analytica Chimica Acta, 2001，450: 215.
[18] McIntire G L. Crit. Rev. Anal. Chem., 1990, 21: 257.
[19] Carboneli V, Mauri A R, Salvador A, et al. J. Anal. At. Spectrom., 1991，6: 581.