加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2012, Vol. 32 Issue (12): 3217-3219    DOI: 10.3964/j.issn.1000-0593(2012)12-3217-03
光谱学与光谱分析 |
Characterization of Pesticide Residual Dynamics by In Situ Attenuated Total Reflection FTIR
YAO Yan1, ZHANG Ping2*, CHEN Qi-jie2, LIU Wen-feng2, ZENG Juan2, XIE Jian-jun3, SUN Li-li1, WANG Xiao-lan1
1. Guangzhou Key Laboratory for Functional Studies on Plant Stress-Resistant Genes, School of Life Science, Guangzhou University, Guangzhou 510006, China
2. School of Chemistry and Chemical Engineering, Guangzhou University, Guangzhou 510006, China
3. Guangdong Entry-Exit Inspection and Quarantine Bureau, Guangzhou 510623, China