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SPECTROSCOPY AND SPECTRAL ANALYSIS  2012, Vol. 32 Issue (05): 1203-1208    DOI: 10.3964/j.issn.1000-0593(2012)05-1203-06
光谱学与光谱分析 |
Phase Correction Technology Research and Improvement Based on Single-Sided Interferograms in FTIR
ZHANG Min-juan2, ZHANG Ji-long1, 2*, WANG Zhi-bin1, 2, JING Ning2, HAO Jian2
1. Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministry of Education, Taiyuan 030051, China2. Engineering Technology Research Center of Shanxi Province for Opto-Electronic Information and Instrument, North University of China, Taiyuan 030051, China