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SPECTROSCOPY AND SPECTRAL ANALYSIS  2008, Vol. 28 Issue (02): 291-294    DOI: 10.3964/j.issn.1000-0593.2008.02.014
光谱学与光谱分析 |
Measurement and Analysis of Nanometer Particles of Silica and Carbon Black by Diffuse Reflection FTIR Spectra
YANG Xiao-zhan1,TANG Chong-min1,LIU Zi-li2,YAO Yong-yi1,LI Rui-xia1,WU Da-cheng1*
1. Textile Research Institute, Sichuan University, Chengdu 610065, China
2. Chengdu Donglanxing Sci-Tech Company, Chengdu 610051, China