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SPECTROSCOPY AND SPECTRAL ANALYSIS  2008, Vol. 28 Issue (02): 253-255    DOI: 10.3964/j.issn.1000-0593.2008.02.005
光谱学与光谱分析 |
Structural and Optical Characterization of ZnO Thin Films Grown by Plasma-Assisted Molecular Beam Epitaxy
LAN Zhen-li1,ZHANG Xi-qing1,YANG Guang-wu2,SUN Jian1,LIU Feng-juan1,HUANG Hai-qin1 ,ZHANG Rui3, YIN Peng-gang3,GUO Lin3,SONG Yu-chen4
1. Key Laboratory of Luminescence and Optical Information,Ministry of Education,Institute of Optoelectronic Technology, Beijing Jiaotong University,Beijing 100044,China2. School of Science,Tianjin Polytechnic University,Tianjin 300160,China3. School of Material Science and Engineering, Beijing University of Aeronautics & Astronautics, Beijing 100083, China4. School of Science, Lishui University, Lishui 323000, China