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SPECTROSCOPY AND SPECTRAL ANALYSIS  2011, Vol. 31 Issue (06): 1712-1716    DOI: 10.3964/j.issn.1000-0593(2011)06-1712-05
光谱学与光谱分析 |
Boundary Threshold Value Method Used in Crystalline Material Internal Defect Detection by Short Wavelength X-Ray Diffraction
MU Jian-lei1,ZHANG Jin1*,GAO Zheng-huan1,ZHENG Lin2,HE Chang-guang2
1. Beijing Key Laboratory for Corrosion, Erosion and Surface Technology, University of Science and Technology Beijing, Beijing 100083, China
2. Institute of Southwest Technology Engineering, Chongqing 400039, China