| 光谱学与光谱分析 |
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| Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement |
| HU Guang-chun, ZHANG Wei-guang |
| Institute of Nuclear Physics and Chemistry, China Academy of Engineeering Physics, Mianyang 621900, China |
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Abstract Tritium is very important fusion materials，it has been broad applied both in military area and in civil area. It is very important to study the depth profile and composition of tritium in materials. This thesis establishes the whole simulation method for tritium b-ray induced X-ray spectrometry technique and researches the algorithm of X-ray spectra simulation, and the X-ray spectrum and the depth and composition of tritium based on simulation has been investigated to expose their relationships. The results show that there is a corresponding relationship between depth profile and X-ray spectra, and the results lay a foundation for further research on inverse problem.
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Received: 2010-05-10
Accepted: 2010-08-20
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Corresponding Authors:
HU Guang-chun
E-mail: hugc_caep@sina.com
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