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SPECTROSCOPY AND SPECTRAL ANALYSIS  2010, Vol. 30 Issue (08): 2184-2186    DOI: 10.3964/j.issn.1000-0593(2010)08-2184-03
光谱学与光谱分析 |
Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals
LI Rui-hong, HAN Yue-ping*, ZHOU Han-chang, HAN Yan
National Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan 030051, China