光谱学与光谱分析 |
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Doppler Effect on Width of Characteristic Line in Plasma Induced by Pulsed Laser Ablating Al |
SONG Yi-zhong1, 2,HE An-zhi1 |
1. School of Science, Nanjing University of Science and Technology, Nanjing 210094, China 2. Department of Physics, Dezhou college, Dezhou 253000, China |
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Abstract Aluminum (Al) plasma was induced with a pulsed Nd: YAG laser beam ablating Al target in Ar. Time-resolved information of the plasma radiation was taken with time-resolved technique, and the spectra of the radiation were recorded with an optical multi-path analyzer (OMA Ⅲ), whereupon, time-resolved spectra of the plasma radiation induced by pulsed laser were acquired. Based on the experiment data, Al resonant double lines, Al Ⅰ 396.15 nm, Al Ⅰ 394.40 nm, were respectively fitted with Lorentz, Gauss and their linear integrated function (abbr. Integrated function), whereupon, Lorentz and Gauss elements were separated from the experiment data profile curve. By contrasting Lorentz with Gauss curve separated, it was found that the experiment curve mainly consisted of Lorentz element, a with little Gauss. By contrasting Lorentz with Integrated fitting curve for experiment data, a visual picture of the characteristic lines broadened by Doppler effect was exhibited. According to the visual picture, the increase of full half-high width of the characteristic line broadened by Doppler effect was estimated. It was about 2×10-3-8×10-3 nm, approximating the theoretical value 6.7×10-3 nm. As a result, Doppler effect on the width of characteristic lines in the plasma could be reasonably explained by curve fitting analysis and theoretical calculation.
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Received: 2003-01-20
Accepted: 2003-06-03
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Corresponding Authors:
SONG Yi-zhong
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Cite this article: |
SONG Yi-zhong,HE An-zhi. Doppler Effect on Width of Characteristic Line in Plasma Induced by Pulsed Laser Ablating Al [J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2005, 25(05): 655-659.
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URL: |
https://www.gpxygpfx.com/EN/Y2005/V25/I05/655 |
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