加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2010, Vol. 30 Issue (01): 184-187    DOI: 10.3964/j.issn.1000-0593(2010)01-0184-04
光谱学与光谱分析 |
Monitoring Stripe Rust of Winter Wheat Using PHI Based on Sensitive Bands
LUO Ju-hua1, 2, HUANG Wen-jiang1*, GU Xiao-he1, JI Ning1, MA Li1, SONG Xiao-yu1, LI Wei-guo1, WEI Zhao-ling2
1.National Engineering Research Center For Information Technology in Agriculture, Beijing 100097, China
2.Resources and Environment College of Anhui Agricultural University, Hefei 230036, China