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SPECTROSCOPY AND SPECTRAL ANALYSIS  2009, Vol. 29 Issue (06): 1702-1706    DOI: 10.3964/j.issn.1000-0593(2009)06-1702-05
光谱学与光谱分析 |
RVM Supervised Feature Extraction and Seyfert Spectra Classification
LI Xiang-ru1, 2, 5,HU Zhan-yi1,ZHAO Yong-heng3,LI Xiao-ming4
1. Institute of Automation, Chinese Academy of Sciences, Beijing 100080, China2. College of Information and Electrical Engineering, Shandong University of Science and Technology, Qingdao 266510, China3. National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China4. School of Mathematical Science, Shanxi University, Taiyuan 030006, China5. School of Mathematical Science, South China Normal University, Guangzhou 510631, China