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SPECTROSCOPY AND SPECTRAL ANALYSIS  2006, Vol. 26 Issue (07): 1185-1189
光谱学与光谱分析 |
Study on In-Plane Optical Anisotropy of Semiconductor Materials by Reflectance Difference Spectroscopy
ZHAO Lei1, CHEN Yong-hai2, ZUO Yu-hua1, WANG Hai-ning3, SHI Wen-hua1
1. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
2. Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
3. State Key Laboratory of Sensing Technique, Institute of Electronics, Chinese Academy of Sciences, Beijing 100080, China