| 光谱学与光谱分析 |
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| Development of X-Ray Excited Fluorescence Spectrometer |
| NI Chen, GU Mu*, WANG Di, CAO Dun-hua, LIU Xiao-lin, HUANG Shi-ming |
| Key Laboratory of Waves & Microstructure Materials, Bohr Institute of Solid State Physics，Tongji University，Shanghai 200092，China |
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Abstract An X-ray excited fluorescence spectrometer was developed with an X-ray tube and a spectrometer. The X-ray tube, spectrometer, autocontrol method and data processing selected were roundly evaluated. The wavelength and detecting efficiency of the apparatus were calibrated with the mercury and tungsten bromine standard lamps, and the X-ray excited emission spectra of BaF2, CsⅠ(Tl) crystals were measured. The results indicate that the apparatus has advantages of good wavelength resolution, high stability, easy to operation and good radioprotection. It is a wery effective tool for exploration of new scintillation materials.
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Received: 2008-05-08
Accepted: 2008-08-12
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Corresponding Authors:
GU Mu
E-mail: mgu@mail.tongji.edu.cn
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