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SPECTROSCOPY AND SPECTRAL ANALYSIS  2006, Vol. 26 Issue (04): 753-756
光谱学与光谱分析 |
Surface and Interface Analysis of PTCDA/ITO Using X-Ray Photoelectron Spectroscopy (XPS)
OU Gu-ping1, 2,SONG Zhen3,GUI Wen-ming1,ZHANG Fu-jia1*
1. School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China
2. School of Physics, Hunan University of Science and Technology, Xiangtan 411201, China
3. School of Basic Courses, Beijing Institute of Machinery, Beijing 100085, China