| 光谱学与光谱分析 |
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| The Application of Inductively Coupled Plasma Atomic Emission Spectrometry/Mass Spectrometry to the Analysis of Advanced Ceramic Materials |
| WANG Zheng1, WANG Shi-wei1, QIU De-ren2, YANG Peng-yuan2* |
1. Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
2. Department of Chemistry, Fudan University, Shanghai 200433, China |
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Abstract Advanced ceramics have been applied to various important fields such as information science, aeronautics and astronautics, and life sciences. However, the optics and electric properties of ceramics are significantly affected by the micro and trace impurities existing in the material even at very low concentration level. Thus, the accurate determination of impurities is important for materials preparation and performance. Methodology of the analysis of advanced ceramic materials using ICP-AES/MS was reviewed in the present paper for the past decade. Various techniques of sample introduction, especially advances in the authors’ recent work, are described in detail. The developing trend is also presented. Sixty references are cited.
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Received: 2008-08-10
Accepted: 2008-11-20
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Corresponding Authors:
YANG Peng-yuan
E-mail: pyyang@fudan.edu.cn
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