| 光谱学与光谱分析 |
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| A Rapid Method for the Measurement of Major and Minor Elements in Vanadium Titanium Magnetite Sample |
| CHEN Yong-jun1, DENG Sai-wen1, DONG De-fan2, ZHENG Miao-zi1 |
1. National Research Center of Geoanalysis, Beijing 100037, China
2. Shijiazhuang University of Economics, Shijiazhuang 050031, China |
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Abstract A high resolution (203 eV/Mn Kα) portable X-ray fluorescence spectrometer has been developed and the measurement of major and minor elements in vanadium titanium magnetite sample was carried out. An 241Am radioactive source for X-ray excitation, a Si-PIN detector and a 2048 channel analyzer for the measurement of vanadium titanium magnetite direct powder sample were used. The correction methods for interferences, calibration and drift are presented. The method is simply, accurate and rapid. The detection limit is an order of magnitude lower compared with a sealed proportional counter system.
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Received: 2004-08-21
Accepted: 2005-01-15
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Corresponding Authors:
CHEN Yong-jun
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| Cite this article: |
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CHEN Yong-jun,DENG Sai-wen,DONG De-fan, et al. A Rapid Method for the Measurement of Major and Minor Elements in Vanadium Titanium Magnetite Sample[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2005, 25(12): 2085-2087.
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| URL: |
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https://www.gpxygpfx.com/EN/Y2005/V25/I12/2085 |
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