| 光谱学与光谱分析 |
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| The Stark Broadening and Stark Shift with Different Electric Microfield Distribution Functions |
| RAN Jun-xia1,LI Xia1,ZHANG Shao-peng2,DONG Li-fang1 |
1. College of Physics Science and Technology, Hebei University, Baoding 071002, China
2. Department of Physical Education, Hebei University, Baoding 071002, China |
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Abstract The Stark broadening and Stark shift were described with different electric microfield distribution functions. These microfield distribution functions include Holtsmark, Neutral Point, Nearest-Neighbor and Mayer model microfield distribution function. The Stark profiles with four microfield distribution functions were studied and the Stark broadening and Stark shift were obtained from the Stark profiles to study the influence of different electric microfield distribution functions on Stark broadening and Stark shift. The results show that the influence of different electric microfield distribution functions on Stark broadening and Stark shift increases with the plasma ions impact parameter with the same electrons impact broadening parameter. With the increase in the plasma electrons impact parameter the influence of different electric microfield distribution functions increases with the same ion impact broadening parameter. Especially, the influence of Mayer model electric microfield distribution function is very distinct when the ion impact broadening parameter is larger. It is illuminated that the plasma ions intense impact has great influence on the spectral line profile. It is very important for the plasma diagnosis to select appropriate electric microfield distribution function. The results have important reference for the plasma diagnosis.
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Received: 2008-11-08
Accepted: 2009-02-10
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Corresponding Authors:
RAN Jun-xia
E-mail: rjxhbu@hbu.cn
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