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SPECTROSCOPY AND SPECTRAL ANALYSIS  2007, Vol. 27 Issue (04): 675-678
光谱学与光谱分析 |
Application of FTIR and XPS Technique to the Analysis of the Mixture Containing Chromium in a Low Valence State
BAI Yu-lan1, 2,XU Hong-bin1*,ZHANG Yi1,LI Zuo-hu1
1. Institute of Process Engineering, Chinese Academy of Sciences, Beijing 100080, China
2. Graduate School of the Chinese Academy of Sciences, Beijing 100039, China