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SPECTROSCOPY AND SPECTRAL ANALYSIS  2020, Vol. 40 Issue (10): 3066-3070    DOI: 10.3964/j.issn.1000-0593(2020)10-3066-05
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Terahertz Thickness Measurement Based on Stochastic Optimization Algorithm
ZHANG Hong-zhen1, 2, HE Ming-xia1, 2*, SHI Li-li3, WANG Peng-fei1, 2
1. State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
2. School of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
3. Research Institute of Superconductor Electronics (RISE), School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China