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SPECTROSCOPY AND SPECTRAL ANALYSIS  2019, Vol. 39 Issue (11): 3433-3437    DOI: 10.3964/j.issn.1000-0593(2019)11-3433-05
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Study on Measurement of the Damage Threshold of Silicon Nitride Ceramics under Pulsed Laser Irradiation by Spectroscopy
CAI Peng-cheng, LI Shuang, CAI Hong-xing*, TAN Yong, SHI Jing, MIAO Xin-hui
College of Science, Changchun University of Science and Technology, Changchun 130022, China