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SPECTROSCOPY AND SPECTRAL ANALYSIS  2019, Vol. 39 Issue (08): 2645-2650    DOI: 10.3964/j.issn.1000-0593(2019)08-2645-06
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In-Situ Wavelength Calibration of Fast-Response Extreme Ultraviolet Spectrometers on Experimental Advanced Superconducting Tokamak and Its Application
YAO Li-ming1, 2, ZHANG Ling3*, XU Zong4, 5, YANG Xiu-da6, WU Cheng-rui6, ZHANG Rui-rui3, YANG Fei3, WU Zhen-wei3, YAO Jian-ming3, GONG Xian-zu3, HU Li-qun3
1. Institute of Technical Biology and Agriculture Engineering, Chinese Academy of Sciences, Hefei 230026, China
2. Hefei Insititutes of Physical Science, University of Chinese Academy of Sciences, Hefei 230026, China
3. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230026, China
4. Advanced Energy Research Center, Shenzhen University, Shenzhen 518060, China
5. Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China
6. Science Island Branch of Graduate School, Graduate School of University of Science and Technology of China, Hefei 230026, China