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SPECTROSCOPY AND SPECTRAL ANALYSIS  2019, Vol. 39 Issue (06): 1736-1741    DOI: 10.3964/j.issn.1000-0593(2019)06-1736-06
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Near Infrared Spectroscopy Process Pattern Fault Detection Based on Mutual Information Entropy
GAO Shuang, LUAN Xiao-li*, LIU Fei
Key Laboratory for Advanced Process Control of Light Industry of Ministry of Education, Institute of Automation, Jiangnan University, Wuxi 214122, China