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SPECTROSCOPY AND SPECTRAL ANALYSIS  2018, Vol. 38 Issue (12): 3929-3933    DOI: 10.3964/j.issn.1000-0593(2018)12-3929-05
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Experimental Study of Material K-Edge Characteristics Identification Based on X-ray Photon-Counting Detection Technique
HE Peng1,2, WU Xiao-chuan1, AN Kang2, DENG Gang3, WANG Xing3, ZHOU Zhong-xing4, WEI Biao1,2, FENG Peng1,2*
1. The Key Lab of Optoelectronic Technology and Systems of Ministry of Education, Chongqing University, Chongqing 400044, China
2. ICT-NOT Engineering Research Center of Ministry of Education, Chongqing University, Chongqing 400044, China
3. The Key Laboratory of Rheological Science and Technology of Ministry of Education, Chongqing University, Chongqing 400044, China
4. School of Precision Instruments and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China