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SPECTROSCOPY AND SPECTRAL ANALYSIS  2018, Vol. 38 Issue (09): 2720-2724    DOI: 10.3964/j.issn.1000-0593(2018)09-2720-05
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Wavelength Selective Terahertz Time-Domain Spectroscopy for Paper Thickness Measurement
CAO Bing-hua1, WANG Wei*, FAN Meng-bao2, WEI Zhong-liang3
1. School of Information and Control Engineering, China University of Mining and Technology, Xuzhou 221116, China
2. School of Mechatronic Engineering, China University of Mining and Technology, Xuzhou 221116, China
3. School of Computer Science and Engineering, Anhui University of Science and Technology, Huaian 230001, China