| 光谱学与光谱分析 |
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| Genesis Study of Omphacite at High Pressure and High Temperature |
| XIAO Ben-fu1,3, YI Li1*, WANG Duo-jun2, XIE Chao1,TANG Xue-wu3, LIU Lei1, CUI Yue-ju1 |
1. CEA Key Laboratory of Earthquake Prediction (Institute of Earthquake Science, China Earthquake Administration), Beijing 100036, China
2. Key Laboratory of Computational Geodynamics, University of Chinese Academy of Sciences, Beijing 100049, China
3. Engineering Research Center of Hunan Earthquake Bureau, Changsha 410001, China |
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Abstract The melting and recrystallizing experiments of alkali basalt powder and mixture of pure oxides mixed as stoichiometry were performed at 3 GPa and 1 200 ℃. Electronic microprobe analysis and Raman spectra showed that the recrystallized products were omphacites, the FWHM (full width at half maximum) of the Raman peak was narrow and its shape was sharp, which is attributed to the stable Si—O tetrahedral structure and the high degree of order in omphacite. Based on the results of previous studies, the influencing factors of omphacite genesis and its primary magma were discussed. The results showed that the formation of omphacite could be affected by many factors, such as the composition of parent rocks, the concentration of fluid in the system and the conditions of pressure and temperature. This result could support some experimental evidences on the genesis studies of omphacite and eclogite.
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Received: 2013-02-01
Accepted: 2013-04-21
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Corresponding Authors:
YI Li
E-mail: hnyili@126.com
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