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SPECTROSCOPY AND SPECTRAL ANALYSIS  2013, Vol. 33 Issue (08): 2267-2271    DOI: 10.3964/j.issn.1000-0593(2013)08-2267-05
光谱学与光谱分析 |
Correction Method for Infrared Spectral Emissivity Measurement System Based on Integrating Sphere Reflectometer
ZHANG Yu-feng, DAI Jing-min, ZHANG Yu, PAN Wei-dong, ZHANG Lei
School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China