光谱学与光谱分析 |
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High Resolution Refractive Index Sensor Based on the Non-Complete Surface State of 1-D Photonic Crystal. |
YAN Jiang-zhou1, 2, WU Yi-hui1*, XUAN Ming1, HAO Peng1 |
1. State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China 2. Graduate University of Chinese Academy of Sciences, Beijing 100049, China |
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Abstract A novel refractive index sensor based on one-dimensional photonic crystal non-complete surface defect is introduced and the principle and the method of the sensor are discussed. The experiment system used to detect the refractive index was constructed to get high resolution and high Q-value. The sensor is verified by detecting the dimethyl sulphone solution. The experimental result indicates that this refractive index sensor’s sensitivity is 3 025 nm·RIU-1, and when the resolution of spectrometer is 0.01 nm the resolution of this sensor is 3.3×10-6 RIU. The Q value of this sensor is 260, and the sensor has good linearity in 1.4~1.42 range (the linearity is 0.991 27). It was analyzed how the photonic crystal periodicity and liquid thickness affect the Q value of the sensor. The result proved that this kind of total reflection photonic crystal surface wave sensor is label free, which is similar with SPR sensor, and the sensor has high resolution, high Q-value and has real-time survey characteristic.
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Received: 2010-05-24
Accepted: 2010-10-09
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Corresponding Authors:
WU Yi-hui
E-mail: yihuiwu@ciomp.ac.cn
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