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SPECTROSCOPY AND SPECTRAL ANALYSIS  2008, Vol. 28 Issue (06): 1426-1429    DOI: 10.3964/j.issn.1000-0593.2008.06.021
光谱学与光谱分析 |
X-Ray Hardening Correction for ICT in Testing Workpiece
PENG Guang-han1,2,CAI Xin-hua1,HAN Zhong3,YANG Xue-heng3
1. College of Physics and Electronic Science, Hunan University of Arts and Science, Changde 415000, China
2. College of Automation, Chongqing University, Chongqing 400030, China
3. College of Science, Chongqing University, Chongqing 400030, China