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SPECTROSCOPY AND SPECTRAL ANALYSIS  2017, Vol. 37 Issue (03): 933-938    DOI: 10.3964/j.issn.1000-0593(2017)03-0933-06
光谱学与光谱分析 |
The Research of Flatfielding Correction Method for Spatial Heterodyne Spectrometer at Systematic Level
SHI Hai-liang1, 2, LI Zhi-wei1, 2, LUO Hai-yan1, 2, XIONG Wei1, 2
1. Key Laboratory of Optical Calibration and Characterization of Chinese Academy of Sciences,Hefei 230031, China
2. Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China