加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2017, Vol. 37 Issue (03): 685-691    DOI: 10.3964/j.issn.1000-0593(2017)03-0685-07
光谱学与光谱分析 |
Radiation Temperature Measurement Technology Based on the Basis of Spectral Emissivity Function
ZHU Ze-zhong1,2, SHEN Hua1,2*, WANG Nian1,2, ZHU Ri-hong1,2
1. School of Electronic Engineering and Photoelectric Technology, Nanjing University of Science& Technology, Nanjing 210094, China
2. Key Laboratory of Advanced Solid-State Laser Technology, Ministry of Industry and Information Technology, Nanjing University of Science& Technology,Nanjing 210094, China