| 光谱学与光谱分析 |
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| A Concept Design of Flat-Field Spectrograph for Wide Wavelength Range |
| LI Shi-yuan1, ZHANG Guang-cai2, TENG Ai-ping3* |
| 1. Shangdong University, Ji’nan 250100，China2. Beijing Institute of Applied Physics and Computational Mathematics, Beijing 100088, China3. China University of Mining & Technology, Beijing 100083, China |
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Abstract The radiation spectrum from the plasmas contains a large amount of information of plasmas. Thus, one of the most effective methods to detecting the plasma parameters is measure the plasma radiation spectrum. Until now, since the restriction of the Toshiba mechanically ruled aberration-corrected concave gratings, the measurable wavelength range of the incidence flat-field grazing spectrometer in the soft X-ray range are only from 5 to 40 nm. In order to extend the wavelength rang of grazing incidence flat-field spectrometer, first, a grazing incidence concave reflection grating ray-trace code is written using optical path equation. Second, under the same conditions with reference 6, we compare our numerical results with Harada’s results. The results show that our results agree very well with the results of Harada. The results of comparison show that our ray-trace code is believable. Finally, the variety of the flat-field curves are detailedly investigated using the ray-trace code with the different grazing incidence conditions. The results show that the measurable wavelength range of the incidence flat-field grazing spectrometer are extended to 5~80 nm from the soft X-ray wavelength range of 5~40 nm. This result theoretically demonstrates the possibility of expanded the traditional band flat-field grazing incidence spectrometer from soft X-ray band to the extreme ultraviolet (XUV), and also bring a new design ideas for improving the use of grazing incidence flat field concave grating.
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Received: 2014-04-19
Accepted: 2014-08-20
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Corresponding Authors:
TENG Ai-ping
E-mail: tengaiping@cumtb.edu.cn
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