加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2015, Vol. 35 Issue (01): 267-271    DOI: 10.3964/j.issn.1000-0593(2015)01-0267-05
光谱学与光谱分析 |
Study on a New Method for Instrumental Line Shape Measurement of Spatial Heterodyne Interference Spectrometer
XIONG Wei1, 2, 3, SHI Hai-liang2, YU Neng-hai1, 2
1. Key Laboratory of Electromagnetic Space Information, Chinese Academy of Sciences, Hefei 230022, China
2. Department of Electronic Engineering and Information Science, University of Science and Technology of China, Hefei 230022, China
3. Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China