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SPECTROSCOPY AND SPECTRAL ANALYSIS  2012, Vol. 32 Issue (04): 993-996    DOI: 10.3964/j.issn.1000-0593(2012)04-0993-04
光谱学与光谱分析 |
Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures
SHI Bin, ZHANG Hai-jun, WU Lan, ZHANG Dong-xian*
State Key Laboratory of Modern Optical Instruments, Zhejiang University, Hangzhou 310027, China