| 光谱学与光谱分析 |
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| Quantitative Analysis of the Concentration of Br-Doping in Micro-Shell Coating with XRF |
| MA Xiao-jun,GAO Dang-zhong*,FENG Jian-hong,LI Yu-hong,YE Cheng-gang,LIU Yuan-qiong |
| Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China |
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Abstract In inertial confinement fusion (ICF) physics experiment, the micro-shell that contains Br-doped CH coating must be characterized for doping Br concentration level. X-ray fluorescence (XRF), with its unique capability to quantitatively determine concentrations of most elements simultaneously and non-destructively, is generally the method of choice for total dopant (Z＞11) concentration. In the present paper, a method to determine the dopant concentration in ICF micro-shell coating with X-ray fluorescence spectrometry is described, and the calibration model is founded by the calculation of fluorescence intensity of film and micro-shell sample. Based on the calibration model, the fluorescence intensity vs concentration of Br-doped CH coating of micro-shell was obtained. The experiment result shows that X-ray fluorescence spectrometry is a nondestructive and accurate method of measurement of coating dopant in the inertial confinement fusion micro-shell sample, and the measuring error is about 5% for Br doped CH coating of micro-shells with 10 micron thickness coating.
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Received: 2008-05-16
Accepted: 2008-08-18
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Corresponding Authors:
GAO Dang-zhong
E-mail: dgaocn@yahoo.com.cn
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