Study of Time Characteristics in Spectrometer Dynamic Sampling
XIONG Hui1, 2, YANG Xue1, 2, ZHOU Mei2, LI Gang2*, LIN Ling2
1. School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin 300387, China 2. State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China
Abstract:The present paper uses the relationship between sawtooth wave’s amplitude and time’s linear code to test and analyze a spectrometer. The result shows that the sampling time is associated with the integration time and the sampling interval closely relates with integral time, and the fluctuation range of sampling interval was further explored. This paper provides the reference of the integral time for the analysis focused on spectrum time characteristic, proposes a method to evaluate the dynamic time properties, and contributes to the assessment and application of the dynamic characteristics of the spectrum.
Key words:Time characteristic of dynamic sampling;Spectrometer;Sampling time interval;Linear coding;Integral time
[1] Afara I O, Singh S, Oloyede A. Journal of the Mechanical Behavior of Biomedical Materials, 2012, 20: 249. [2] Ghasemi-Varnamkhasti M, Saied Mohtasebi S, Rodriguez-Mendez M L, et al. Talanta, 2012, 89: 286. [3] QIAO Xiao-yan,WANG Yan-jing,LI Gang(乔晓艳,王艳景,李 刚). Optics and Precision Engineering(光学 精密工程),2010,18(11):2369. [4] JIA Ping,ZHANG Bao-ju,ZHANG Zhi-yong,et al(贾 萍,张宝菊,张志勇,等). Journal of Infrared and Millimeter Waves(红外与毫米波学报),2010,29(2):132. [5] Wang Huiquan, Li Gang, Zhao Zhe, et al. Transactions of the Institute of Measurement & Control, 2013, 35(1): 16. [6] Xiong Chan,Li Gang,Lin Ling. Applied Spectroscopy,2012,66(11):1347. [7] CHEN Xing-dan(陈星旦). Optics and Precision Engineering(光学 精密工程),2008,16(5):760. [8] LIANG Zhi-guo,MENG Xiao-feng(梁志国, 孟晓风). Journal of Beijing University of Aeronautics and Astronautics(北京航空航天大学学报),2010,36(10):1023. [9] Filippo Attivissimo, Attilio Di Nisio, Nicola Giaquinto. IEEE Transactions on Instrumentation and Measurement, 2011, 60(2): 560. [10] Wang C M Jack, Hale Paul D, Jargon Jeffrey A, et al. IEEE Transactions on Instrumentation and Measurement, 2012, 61(10): 2689. [11] Azeredo-Leme C. Circuits and Systems Magazine, IEEE, 2011, 11(3): 26. [12] RENG Li-bing,WEI Hao-yun,LI Yan(任利兵,尉昊赟,李 岩). China Optical Conference Proceedings(中国光学学会2010年光学大会论文集),2010.