Abstract：This paper proposes a novel technique of Raman-atomic force microscopy (AFM) combining micro region Raman spectroscopy and AFM imaging. An in-situ probe unit which can simultaneously realize the detection of Raman spectrum and the measurement of AFM image was designed, and a related Raman-AFM system was constructed. Using this system, some experiments were carried out to acquire micro region Raman spectra and AFM images of ZnO nano-particle and TiO2 film. The results show that the Raman spectra of both samples are in agreement with theoretical vaues, and the AFM images represent their micro/nano-structures quite well. These researches prove the feasibility of the Raman-AFM technique which has the potential of being widely applied in the fields of Raman spectroscopy and micro/nano-technology.
史 斌，章海军，吴 兰，张冬仙*. 用于Raman光谱与微纳米结构同步检测的Raman-AFM系统研究[J]. 光谱学与光谱分析, 2012, 32(04): 993-996.
SHI Bin, ZHANG Hai-jun, WU Lan, ZHANG Dong-xian*. Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2012, 32(04): 993-996.
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