Abstract:Thin metal films are good candidates of terahertz detectors, reflectors, waveguides and terahertz quantum-cascade lasers (THz-QCLs). The optical parameter is the basis not only for designing the THz components but also for developing novel optoelectronic materials. In the present paper, the complex refractive indices of the ultra-thin metal (Cr, Ni and Ti) films in the THz band were obtained by the THz differential time-domain spectroscopy. The reflection spectra of the GaAs/metals interface were calculated according to the Fresnel formula. The mean reflectance of 25 nm Cr, Ni and Ti are over 80% from 0.3 to 1.5 THz. The results show that ultra-thin metal films can be used for reflectors as well as the electrodes in the THz band.
马凤英,池 泉,苏建坡*,杜艳丽,张微微,陈 明,刘建立,郭茂田,袁 斌 . 超薄金属膜在太赫兹波段的光学特性研究[J]. 光谱学与光谱分析, 2012, 32(03): 610-613.
MA Feng-ying, CHI Quan, SU Jian-po*, DU Yan-li, ZHANG Wei-wei, CHEN Ming, LIU Jian-li, GUO Mao-tian, YUAN Bin . Study on the Optical Properties of Ultra-Thin Metal Films in the THz Band. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2012, 32(03): 610-613.
[1] Bolakis C, Grbovic D, Lavrik N V, et al. Opt. Express, 2010, 18(14): 14488. [2] Naftaly M, Dudley R. Appl. Opt., 2011, 50(19): 3201. [3] Gagan Kumar, Shashank Pandey, Albert Cui, et al. New J. Phys., 2011, 13(3): 033024. [4] Thoman A, Kern A, Helm H, et al. Phys. Rev. B, 2008, 77(19): 195405. [5] JIN Bin, LI Tong, ZHOU Qing-li, et al. (金 彬,李 彤,周庆莉,等). Chinese Journal of Lasers(中国激光),2009,36(s1): 337. [6] Ioachim Pupeza, Rafal Wilk, Martin Koch. Opt. Express, 2007, 15(7): 4335. [7] Lee K S, Lu T M, Zhang X C. Microelectron. J., 2003, 34(1): 63. [8] Zhou L, Xu W W, Jin B B, et al. Science China-Technological Sciences, 2010, 53(4): 1012. [9] Corson J, Orenstein J, Seongshik Oh, et al. Phys. Rev. Lett., 2000, 85(12): 2569. [10] Hiroaki Yasuda, Iwao Hosako. Jpn. J. Appl. Phys., 2008, 47(3): 1632. [11] Zhou D X, Parrott E P J, Douglas J P, et al. J. Appl. Phys., 2008, 104(5): 053110. [12] Ordal M A, Bell R J, Alexander R W, et al. Appl. Opt., 1987, 26(4): 744. [13] Mickan S P, Lee K S, Lu T M, et al. Proceeding of SPIE, 2001, 4591: 197. [14] Jiang Z P, Li M, Zhang X C. Appl. Phys. Lett., 2000, 76(22): 3221.