Investigation of the Hyperspectral Image Characteristics of Wheat Leaves under Different Stress
ZHANG Dong-yan1, 2, ZHANG Jing-cheng1, 2, ZHU Da-zhou1, WANG Ji-hua1, 2, LUO Ju-hua1, ZHAO Jin-ling1, HUANG Wen-jiang1*
1. National Engineering Research Center for Information Technology in Agriculture, Beijing 100097, China 2. Institute of Remote Sensing & Information Technique, Zhejiang University, Hangzhou 310029, China
Abstract：The diagnosis of growing status and vigor of crops under various stresses is an important step in precision agriculture. Hyperspectral imaging technology has the advantage of providing both spectral and spatial information simultaneously, and has become a research hot spot. In the present study, auto-development of the pushbroom imaging spectrometer (PIS) was utilized to collect hyperspectral images of wheat leaves which suffer from shortage of nutrient, pest and disease stress. The hyperspectral cube was processed by the method of pixel average step by step to highlight the spectral characteristics, which facilitate the analysis based on the differences of leaves reflectance. The results showed that the hyperspectra of leaves from different layers can display nutrient differences, and recognize intuitively different stress extent by imaging figures. With the 2 nanometer spectral resolution and millimeter level spatial resolution of PIS, the number of disease spot can be qualitatively calculated when crop is infected with diseases, and, the area of plant disease could also be quantitatively analyzed; when crop suffered from pest and insect, the spectral information of leaves with single aphid and aphids can be detected by PIS, which provides a new means to quantitatively detect the aphid destroying of wheat leaf. The present study demonstrated that hyperspecral imaging has a great potential in quantitative and qualitative analysis of crop growth.
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