Plane Scan Analysis of the Surface of White and Blue Porcelain by SRXRF Method
YANG Yi-min1, FENG Min1, ZHU Jian1, MAO Zhen-wei1, WANG Chang-sui1，HUANG Yu-ying2, HE Wei2
1. Department of Science and Technology Archaeology, University of Science and Technology of China，Hefei 230026，China 2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039，China
Abstract：In this article, the authors analyze the surface of a piece of porcelain shred in Xuande Period by SRXRF, and the result shows that each peak area of elements differs in distribution pattern. According to the relationship between element peak area and color variation, and yellow fleck in glaze, it is possible to divide 13 elements，i.e. K, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg, Rb, Sr, Y and Zr，into three groups. This phenomenon will indicate how to search the “finger elements" in each dynasty; at the same time, it will present important information for research on the forming mechanism of yellow flecks in glaze.
Key words：White and blue porcelain;SRXRF;Plane scan analysis;Non-destructive identification
杨益民1，冯 敏1，朱 剑1，毛振伟1，王昌燧1*，黄宇营2，何 伟2 . 宣德官窑青花瓷的面扫描分析[J]. 光谱学与光谱分析, 2004, 24(08): 902-906.
YANG Yi-min1, FENG Min1, ZHU Jian1, MAO Zhen-wei1, WANG Chang-sui1，HUANG Yu-ying2, HE Wei2 . Plane Scan Analysis of the Surface of White and Blue Porcelain by SRXRF Method . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2004, 24(08): 902-906.
