Techniques for Pixel Response Nonuniformity Correction of CCD in Interferential Imaging Spectrometer
YAO Tao1,4, YIN Shi-min2, XIANGLI Bin3，Lü Qun-bo4
1. Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710068, China 2. First Field of Trial and Training Air Base of the Chinese People’s Liberation Army, Jiuquan 735018, China 3. Academy of Optoelectronics, Chinese Academy of Sciences, Beijing 100190, China 4. Graduate University of Chinese Academy of Sciences, Beijing 100049, China
Abstract：Based on in-depth analysis of the relative radiation scaling theorem and acquired scaling data of pixel response nonuniformity correction of CCD (charge-coupled device) in spaceborne visible interferential imaging spectrometer, a pixel response nonuniformity correction method of CCD adapted to visible and infrared interferential imaging spectrometer system was studied out, and it availably resolved the engineering technical problem of nonuniformity correction in detector arrays for interferential imaging spectrometer system. The quantitative impact of CCD nonuniformity on interferogram correction and recovery spectrum accuracy was given simultaneously. Furthermore, an improved method with calibration and nonuniformity correction done after the instrument is successfully assembled was proposed. The method can save time and manpower. It can correct nonuniformity caused by other reasons in spectrometer system besides CCD itself’s nonuniformity, can acquire recalibration data when working environment is changed, and can also more effectively improve the nonuniformity calibration accuracy of interferential imaging spectrometer system.
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