Abstract:In inertial confinement fusion (ICF) physics experiment, the micro-shell that contains Br-doped CH coating must be characterized for doping Br concentration level. X-ray fluorescence (XRF), with its unique capability to quantitatively determine concentrations of most elements simultaneously and non-destructively, is generally the method of choice for total dopant (Z>11) concentration. In the present paper, a method to determine the dopant concentration in ICF micro-shell coating with X-ray fluorescence spectrometry is described, and the calibration model is founded by the calculation of fluorescence intensity of film and micro-shell sample. Based on the calibration model, the fluorescence intensity vs concentration of Br-doped CH coating of micro-shell was obtained. The experiment result shows that X-ray fluorescence spectrometry is a nondestructive and accurate method of measurement of coating dopant in the inertial confinement fusion micro-shell sample, and the measuring error is about 5% for Br doped CH coating of micro-shells with 10 micron thickness coating.
Key words:X-ray fluorescence spectrometry;Coating dopant of micro-shell;Calibration model;ICF
马小军,高党忠*,冯建鸿,李玉红,叶成刚,刘元琼 . ICF微球壳层掺溴含量的XRF表征[J]. 光谱学与光谱分析, 2009, 29(06): 1678-1681.
MA Xiao-jun,GAO Dang-zhong*,FENG Jian-hong,LI Yu-hong,YE Cheng-gang,LIU Yuan-qiong . Quantitative Analysis of the Concentration of Br-Doping in Micro-Shell Coating with XRF. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2009, 29(06): 1678-1681.
[1] Hoppe M L, Harding D, Stephens R B. Fusion Technology, 1997, 31(4): 381. [2] HAN Xiao-yuan, ZHUO Shang-jun, WANG Pei-ling(韩小元, 卓尚军, 王佩玲). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2006,26(1): 159. [3] HAN Xiao-yuan, ZHUO Shang-jun, WANG Pei-ling(韩小元, 卓尚军, 王佩玲). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2006,26(2): 353. [4] WANG Gui-hua, TAN Bing-he(王桂华, 谭秉和). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2002,22(2): 328. [5] JI Xin-ming, WANG Jian-ye, JIA Wen-hong, et al(纪新明,王建业,贾文红,等). Acta Optica Sinica(光学学报),2006 26(4): 634. [6] Shiraiwa Toshio, Fujino Nobukatsu. Advance in X-ray Analysis, 1969, 12: 446. [7] Mantler M. Analytice Chimica. Acta, 1986, 188: 25. [8] Pella P, Feng L, Small J. X-ray Spectrometry, 1985,14(3):125. [9] GAO Dang-zhong, LIU Yuan-qiong, LUO Qing, et al(高党忠,刘元琼,罗 青,等). High Power Laser and Particle Beams(强激光与粒子束), 2004, 16(9): 1157.