1. School of Physics, Peking University, Beijing 100871, China 2. Renishaw (Hong Kong Ltd.)，Hong Kong, China 3. School of Electronics Engineering and Computer Science, Peking University, Beijing 100871, China
Abstract：X-ray diffraction and Raman spectra show that the used amorphous SiC and GaN samples are impure. Adopting the new subtracting method with weighted impurity spectra, we obtained amorphous SiC and GaN Raman spectra involving only single component and structure. The good fitting between the calculated phonon density of states (PDOS) and the reduced Raman spectra confirms that the purified Raman spectra is really the amorphous Raman spectra, and the adopted spectral subtracting method with weighted impurity spectra is successful.
Key words：Raman spectra;Amorphous SiC;Amorphous GaN;Phonon density of states
高敏1,刘伟1,杨军涛2,张树霖1*,郭辉3,张国义1. 从不纯样品的光谱中提取单一组分和结构的拉曼谱[J]. 光谱学与光谱分析, 2007, 27(05): 928-931.
GAO Min1,LIU Wei1,YANG Jun-tao2,ZHANG Shu-lin1*,GUO Hui3,ZHANG Guo-yi1 . Study on Extracting Raman Spectra of Single Component and Structure from Impure Amorphous Spectra. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2007, 27(05): 928-931.
